Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) spec

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) spec

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States.

A concise summary that uses abundant images to illustrate the type of information backscattered scanning electron microscopy (BSE) yields. Lucidly written, this

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in